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SAGETRACK

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Journal of Intelligent Material Systems and Structures

Index by Author: Nov 1995; 6 (6) [Table of Contents]

A | B | C | D | E | F | G | H | I | J | K | L | M | N | O | P | Q | R | S | T | U | V | W | X | Y | Z


ABack

Abramovich, Haim [Abstract] [PDF] [References]
Armstrong, William D. [Abstract] [PDF] [References]


BBack

Barrett, David John [Abstract] [PDF] [References]


CBack

Castano, V.M. [Abstract] [PDF] [References]
Cebers, Andrejs [Abstract] [PDF] [References]
Chan, Moses H.W. [Abstract] [PDF] [References]
Chaudhry, Z. [Abstract] [PDF] [References]
Coulter, John P. [Abstract] [PDF] [References]


DBack

De La Luz, C. [Abstract] [PDF] [References]
Don, David L. [Abstract] [PDF] [References]


GBack

Garba, John A. [Abstract] [PDF] [References]
Geng, Z. Jason [Abstract] [PDF] [References]


HBack

Hannsen Su, J. [Abstract] [PDF] [References]
Haynes, Leonard S. [Abstract] [PDF] [References]


JBack

Jensen, David W. [Abstract] [PDF] [References]
Jesse Lim, T. [Abstract] [PDF] [References]


KBack

Kern, Frank J. [Abstract] [PDF] [References]
Kino, Hironori [Abstract] [PDF] [References]
Koval, Leslie R. [Abstract] [PDF] [References]


LBack

Lalande, F. [Abstract] [PDF] [References]
Lee, Hyun [Abstract] [PDF] [References]
Lesieutre, George A. [Abstract] [PDF] [References]
Liang, C. [Abstract] [PDF] [References]


MBack

Matsko, M.G. [Abstract] [PDF] [References]
McDowell, David L. [Abstract] [PDF] [References]
Messer, R. Scott [Abstract] [PDF] [References]


NBack

Nava, R. [Abstract] [PDF] [References]
Newnham, R.E. [Abstract] [PDF] [References]


PBack

Pan, George G. [Abstract] [PDF] [References]
Pletner, Baruch [Abstract] [PDF] [References]
Ponce, M.A. [Abstract] [PDF] [References]


RBack

Rao, Vittal S. [Abstract] [PDF] [References]
Rejón, L. [Abstract] [PDF] [References]
Rogers, C.A. [Abstract] [PDF] [References]
Rogers, C.A. [Abstract] [PDF] [References]
Ruckman, C.E. [Abstract] [PDF] [References]


SBack

Suleman, A. [Abstract] [PDF] [References]
Sullivan, Brian J. [Abstract] [PDF] [References]


TBack

Traversa, Enrico [Abstract] [PDF] [References]


VBack

Venkayya, V.B. [Abstract] [PDF] [References]


WBack

Wada, Ben K. [Abstract] [PDF] [References]
Weili Luo, [Abstract] [PDF] [References]


XBack

Xu, Q.C. [Abstract] [PDF] [References]


YBack

Yarlagadda, Shridhar [Abstract] [PDF] [References]


ZBack

Zhou, S. [Abstract] [PDF] [References]